ASIC Test development Engineer

ASIC Test development Engineer

This role has been designed as 'Hybrid' with an expectation that you will work on average 2 days per week from an HPE office.

Who We Are:

Hewlett Packard Enterprise is the global edge-to-cloud company advancing the way people live and work.

We help companies connect, protect, analyze, and act on their data and applications wherever they live, from edge to cloud, so they can turn insights into outcomes at the speed required to thrive in today's complex world.

Our culture thrives on finding new and better ways to accelerate what's next.

We know varied backgrounds are valued and succeed here.

We have the flexibility to manage our work and personal needs.

We make bold moves, together, and are a force for good.

If you are looking to stretch and grow your career our culture will embrace you.

Open up opportunities with HPE.

Job Description:

Individual contributor role responsible for testability solutions of ASICs, memory, and 2.5D SiPs for Juniper's product development and manufacturing.

Includes both structured ATE-level test as well as system-level/mission-mode (functional) environments.

Roles


* Responsible for developing test strategy and DFT (Design-for-Test) solutions for ASICs and 2.5D SiP (System-in-Package) that supports high test coverage requirements of components and systems.


* This role concentrates on Pre-P0 development and works between HW Eng development teams and Supplier Development Teams


* Works closely with design teams to enable the DFT features in ASICs, validate on ATE, integrate in diagnostics, and implement in manufacturing tests


* Development of innovative DFT IP in collaboration with cross-functional teams inside and outside the company


* Work closely with component engineers to resolve high DPPM ASIC issues at EMS partner sites


* Engage in test standard working groups, such as IEEE 1149, 1687, P1838, JC-42 Solid State Memories


* Trusted advisor on ASIC testability to Juniper teams including ASIC frontend, physical design, DFT, system software, diagnostics, hardware and manufacturing test teams.

The influence occurs from the beginning (ASIC kick-off) to production release.


* Key advocate recognizing and solving structural vs functional test coverage gaps, as well as weaving in new fault models for advanced semiconductor technology nodes


* Demonstrated innovation via patents, published technical papers and conference presentations


* Ownership of ASIC test requirements for ASIC MRDs, phase exit validation, advanced test mode development, fault coverage attainment, achievement of manufacturability objectives and continuous improvement


* Voice of test authority with ASIC suppliers -- working closely with their product/test teams, quality, design engineering and technologists to correlate and eradicate ASIC failures in our systems with their wafer test, package test and BLCT-1.

Able to independently solve NTF (No-Trouble-Found) supplier i...